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"Prognostic methodology for remaining useful life estimation of retention ..."

Nagarajan Raghavan, Daniel D. Frey, Kin Leong Pey (2014)

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DOI: 10.1016/J.MICROREL.2014.07.072

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nagarajan Raghavan, Daniel D. Frey, Kin Leong Pey:
Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory. Microelectron. Reliab. 54(9-10): 1729-1734 (2014)

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