"Assessment of read disturb immunity in conducting bridge memory devices - ..."

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey (2014)

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DOI: 10.1016/J.MICROREL.2014.07.035

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nagarajan Raghavan, Michel Bosman, Kin Leong Pey:
Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective. Microelectron. Reliab. 54(9-10): 2295-2299 (2014)

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