"Sub-1 ns characterization methodology for transistor electrical ..."

Yiming Qu et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.03.022

access: closed

type: Journal Article

metadata version: 2020-06-16

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Yiming Qu, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao:
Sub-1 ns characterization methodology for transistor electrical parameter extraction. Microelectron. Reliab. 85: 93-98 (2018)

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