Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Sub-1 ns characterization methodology for transistor electrical ..."

Yiming Qu et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2018.03.022

access: closed

type: Journal Article

metadata version: 2020-06-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/QuCLHLZ18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/QuCLHLZ18
Yiming Qu, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao:
Sub-1 ns characterization methodology for transistor electrical parameter extraction. Microelectron. Reliab. 85: 93-98 (2018)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.