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"Reliability investigation of light-emitting diodes via low frequency noise ..."

Sandra Pralgauskaite et al. (2015)

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DOI: 10.1016/J.MICROREL.2014.09.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sandra Pralgauskaite, Vilius Palenskis, Jonas Matukas, Justinas Glemza, Grigorij Muliuk, Bronius Saulys, Augustinas Trinkunas:
Reliability investigation of light-emitting diodes via low frequency noise characteristics. Microelectron. Reliab. 55(1): 52-61 (2015)

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