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"Burn-in and thermal cyclic tests to determine the short-term reliability ..."
Julian W. Post, A. Bhattacharyya (2012)
- Julian W. Post, A. Bhattacharyya:
Burn-in and thermal cyclic tests to determine the short-term reliability of a thin film resistance temperature detector. Microelectron. Reliab. 52(7): 1389-1395 (2012)
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