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"Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs."

Michele Piazza et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.043

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/PiazzaDOMCW09
Michele Piazza, Christian Dua, Mourad Oualli, Erwan Morvan, Dominique Carisetti, Frédéric Wyczisk:
Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs. Microelectron. Reliab. 49(9-11): 1222-1225 (2009)

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