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"Single contact beam induced current phenomenon for microelectronic failure ..."

J. C. H. Phang et al. (2003)

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DOI: 10.1016/S0026-2714(03)00280-4

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/PhangCOKCPGS03
J. C. H. Phang, D. S. H. Chan, V. K. S. Ong, S. Kolachina, J. M. Chin, M. Palaniappan, G. Gilfeather, Y. X. Seah:
Single contact beam induced current phenomenon for microelectronic failure analysis. Microelectron. Reliab. 43(9-11): 1595-1602 (2003)

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