"Radiation induced transconductance overshoot in the 130 nm ..."

Chao Peng et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.035

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chao Peng, Yunfei En, Zhengxuan Zhang, Yuan Liu, Zhifeng Lei:
Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs. Microelectron. Reliab. 75: 135-141 (2017)

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