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"A fusion prognostics-based qualification test methodology for ..."

Michael G. Pecht et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.04.002

access: closed

type: Journal Article

metadata version: 2022-10-02

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Michael G. Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps:
A fusion prognostics-based qualification test methodology for microelectronic products. Microelectron. Reliab. 63: 320-324 (2016)

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