"A multiprocess performance analysis chart based on the incapability index ..."

Wen Lea Pearn, C. H. Ko, K. H. Wang (2002)

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DOI: 10.1016/S0026-2714(02)00071-9

access: closed

type: Journal Article

metadata version: 2020-09-18

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Wen Lea Pearn, C. H. Ko, K. H. Wang:
A multiprocess performance analysis chart based on the incapability index C_pp: an application to the chip resistors. Microelectron. Reliab. 42(7): 1121-1125 (2002)

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