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"Statistical distributions of row-hammering induced failures in DDR3 ..."

Kyungbae Park, Donghyuk Yun, Sanghyeon Baeg (2016)

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DOI: 10.1016/J.MICROREL.2016.10.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Kyungbae Park, Donghyuk Yun, Sanghyeon Baeg:
Statistical distributions of row-hammering induced failures in DDR3 components. Microelectron. Reliab. 67: 143-149 (2016)

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