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"Edge current induced failure of semiconductor PN junction during operation ..."

V. V. N. Obreja et al. (2011)

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DOI: 10.1016/J.MICROREL.2010.10.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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V. V. N. Obreja, C. Codreanu, D. Poenar, Octavian Buiu:
Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic. Microelectron. Reliab. 51(3): 536-542 (2011)

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