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"Surface leakage current related failure of power silicon devices operated ..."

K. I. Nuttall, Octavian Buiu, V. V. N. Obreja (2003)

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DOI: 10.1016/S0026-2714(03)00325-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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K. I. Nuttall, Octavian Buiu, V. V. N. Obreja:
Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectron. Reliab. 43(9-11): 1913-1918 (2003)

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