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"Evaluation of AlGaInP LEDs reliability based on accelerated tests."

Eduardo Nogueira, Manuel Vázquez, Neftalí Núñez (2009)

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DOI: 10.1016/J.MICROREL.2009.06.031

access: closed

type: Journal Article

metadata version: 2020-09-05

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Eduardo Nogueira, Manuel Vázquez, Neftalí Núñez:
Evaluation of AlGaInP LEDs reliability based on accelerated tests. Microelectron. Reliab. 49(9-11): 1240-1243 (2009)

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