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"Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low ..."

Sasan Naseh, M. Jamal Deen, Chih-Hung Chen (2006)

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DOI: 10.1016/J.MICROREL.2005.04.009

access: closed

type: Journal Article

metadata version: 2020-03-27

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Sasan Naseh, M. Jamal Deen, Chih-Hung Chen:
Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers. Microelectron. Reliab. 46(2-4): 201-212 (2006)

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