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"Case studies of defect localization based on software-based fault ..."

Takuya Naoe, Taketoshi Mizobe, Kohichi Yokoyama (2014)

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DOI: 10.1016/J.MICROREL.2014.03.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Takuya Naoe, Taketoshi Mizobe, Kohichi Yokoyama:
Case studies of defect localization based on software-based fault diagnosis in comparison with PEMS/OBIRCH analysis. Microelectron. Reliab. 54(6-7): 1433-1442 (2014)

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