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"On the failure path in shear-tested solder joints."

W. H. Moy, Yu-Lin Shen (2007)

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DOI: 10.1016/J.MICROREL.2006.08.021

access: closed

type: Journal Article

metadata version: 2022-06-17

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W. H. Moy, Yu-Lin Shen:
On the failure path in shear-tested solder joints. Microelectron. Reliab. 47(8): 1300-1305 (2007)

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