Stop the war!
Остановите войну!
for scientists:
default search action
"Percolative approach for failure time prediction of thin film ..."
E. Misra et al. (2005)
- E. Misra, Md. M. Islam, Mahbub Hasan, H. C. Kim, T. L. Alford:
Percolative approach for failure time prediction of thin film interconnects under high current stress. Microelectron. Reliab. 45(2): 391-395 (2005)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.