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"Hot carrier degradation modeling of short-channel n-FinFETs suitable for ..."
Ioannis Messaris et al. (2016)
- Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis:
Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. Microelectron. Reliab. 56: 10-16 (2016)
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