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"Universal mechanisms of Al metallization ageing in power MOSFET devices."
Donatien Martineau et al. (2014)
- Donatien Martineau, Colette Levade, Marc Legros, Philippe Dupuy, Thomas Mazeaud:
Universal mechanisms of Al metallization ageing in power MOSFET devices. Microelectron. Reliab. 54(11): 2432-2439 (2014)
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