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"Lifetime estimation of analog circuits from the electrical characteristics ..."

Javier Martín-Martínez et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.088

access: closed

type: Journal Article

metadata version: 2022-10-02

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Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectron. Reliab. 47(9-11): 1349-1352 (2007)

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