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"Study of mechanical stress impact on the I-V characteristics of a power ..."
Emmanuel Marcault et al. (2012)
- Emmanuel Marcault
, Marie Breil, A. Bourennane, Patrick Tounsi, Jean-Marie Dorkel:
Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. Microelectron. Reliab. 52(3): 489-496 (2012)
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