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"Study of mechanical stress impact on the I-V characteristics of a power ..."

Emmanuel Marcault et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.12.028

access: closed

type: Journal Article

metadata version: 2021-10-14

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Emmanuel Marcault, Marie Breil, A. Bourennane, Patrick Tounsi, Jean-Marie Dorkel:
Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. Microelectron. Reliab. 52(3): 489-496 (2012)

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