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"Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS ..."

Fei Ma et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.11.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/MaHDMZWHZ12
Fei Ma, Yan Han, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Cheng-gong Han, Kehan Zhu:
Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. Microelectron. Reliab. 52(8): 1640-1644 (2012)

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