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"Using scanning acoustic microscopy and LM-BP algorithm for defect ..."

Fan Liu et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.10.029

access: closed

type: Journal Article

metadata version: 2020-03-02

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  - https://dblp.org/rec/journals/mr/LiuSFYHL17
Fan Liu, Lei Su, Mengying Fan, Jian Yin, Zhenzhi He, Xiangning Lu:
Using scanning acoustic microscopy and LM-BP algorithm for defect inspection of micro solder bumps. Microelectron. Reliab. 79: 166-174 (2017)

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