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"A similarity based prognostics approach for real time health management of ..."

Changyong Lee, Daeil Kwon (2018)

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DOI: 10.1016/J.MICROREL.2018.02.014

access: closed

type: Journal Article

metadata version: 2021-12-25

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Changyong Lee, Daeil Kwon:
A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression. Microelectron. Reliab. 83: 77-83 (2018)

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