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"A finite weakest-link model of lifetime distribution of high-k gate ..."

Jia-Liang Le (2012)

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DOI: 10.1016/J.MICROREL.2011.09.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jia-Liang Le:
A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress. Microelectron. Reliab. 52(1): 100-106 (2012)

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