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"Reliability of spring pressure contacts under environmental stress."

F. Lang, Uwe Scheuermann (2007)

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DOI: 10.1016/J.MICROREL.2007.07.038

access: closed

type: Journal Article

metadata version: 2020-02-22

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F. Lang, Uwe Scheuermann:
Reliability of spring pressure contacts under environmental stress. Microelectron. Reliab. 47(9-11): 1761-1766 (2007)

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