Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Oxide reliability: influence of interface roughness, structure layout, and ..."

Bakuri Lanchava et al. (2001)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(01)00069-5

access: closed

type: Journal Article

metadata version: 2021-05-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LanchavaBMBM01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LanchavaBMBM01
Bakuri Lanchava, Peter Baumgartner, Andreas Martin, Armand Beyer, Erich Mueller:
Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation. Microelectron. Reliab. 41(7): 1097-1100 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.