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"Series resistance degradation due to NBTI in PMOSFET."
Mahesh S. Krishnan et al. (2002)
- Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li:
Series resistance degradation due to NBTI in PMOSFET. Microelectron. Reliab. 42(9-11): 1433-1438 (2002)
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