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"Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing."

Steven Kasapi, Bruce Cory (2004)

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DOI: 10.1016/J.MICROREL.2004.07.036

access: closed

type: Journal Article

metadata version: 2020-02-22

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Steven Kasapi, Bruce Cory:
Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing. Microelectron. Reliab. 44(9-11): 1535-1539 (2004)

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