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"A low-cost built-in error correction circuit design for STT-MRAM ..."

Wang Kang et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.036

access: closed

type: Journal Article

metadata version: 2023-10-02

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  - https://dblp.org/rec/journals/mr/KangZWZKZCR13
Wang Kang, Weisheng Zhao, Zhaohao Wang, Yue Zhang, Jacques-Olivier Klein, Youguang Zhang, Claude Chappert, Dafine Ravelosona:
A low-cost built-in error correction circuit design for STT-MRAM reliability improvement. Microelectron. Reliab. 53(9-11): 1224-1229 (2013)

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