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"Reliability aspects of semiconductor devices in high temperature applications."

Werner Kanert et al. (2003)

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DOI: 10.1016/S0026-2714(03)00313-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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Werner Kanert, H. Dettmer, Boris Plikat, Norbert Seliger:
Reliability aspects of semiconductor devices in high temperature applications. Microelectron. Reliab. 43(9-11): 1839-1846 (2003)

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