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"Study on electrostatic discharge (ESD) reliability improvement of ..."

M. H. Ji et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.062

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. H. Ji, C.-H. Choi, B. K. Jang, B. K. Kim:
Study on electrostatic discharge (ESD) reliability improvement of ZnO-based multilayered chip varistor(MLV). Microelectron. Reliab. 44(9-11): 1565-1569 (2004)

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