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"Field failure mechanism and improvement of EOS failure of integrated IGBT ..."

Jae-Seong Jeong, Soon-Ha Hong, Sang-Deuk Park (2007)

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DOI: 10.1016/J.MICROREL.2007.07.087

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jae-Seong Jeong, Soon-Ha Hong, Sang-Deuk Park:
Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules. Microelectron. Reliab. 47(9-11): 1795-1799 (2007)

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