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"Multi-valued logic mapping of resistive short and open delay-fault testing ..."

M. Reza Javaheri, Reza Sedaghat (2009)

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DOI: 10.1016/J.MICROREL.2008.11.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Reza Javaheri, Reza Sedaghat:
Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies. Microelectron. Reliab. 49(2): 178-185 (2009)

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