"Trench DMOS interface trap characterization by three-terminal charge ..."

I. Izuddin et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.118

access: closed

type: Journal Article

metadata version: 2020-02-22

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I. Izuddin, M. H. Kamaruddin, Anis Nurashikin Nordin, Norhayati Soin:
Trench DMOS interface trap characterization by three-terminal charge pumping measurement. Microelectron. Reliab. 52(12): 2914-2919 (2012)

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