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"Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: ..."
M. Houssa et al. (2007)
- M. Houssa, Marc Aoulaiche, Stefan De Gendt, Guido Groeseneken
, Marc M. Heyns:
Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectron. Reliab. 47(6): 880-889 (2007)
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