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"Reliability considerations for recent Infineon SiC diode releases."

M. Holz et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.031

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Holz, G. Hultsch, T. Scherg, R. Rupp:
Reliability considerations for recent Infineon SiC diode releases. Microelectron. Reliab. 47(9-11): 1741-1745 (2007)

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