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"Extraction of the lateral distribution of interface traps in MOSFETs by a ..."
Jin He et al. (2001)
- Jin He, Xing Zhang, Ru Huang, Yangyuan Wang:
Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique. Microelectron. Reliab. 41(12): 1953-1957 (2001)
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