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"Investigation of flicker noise in silicon diodes under reverse bias."

Jirí Hájek, Václav Papez, B. Kojecký (2012)

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DOI: 10.1016/J.MICROREL.2011.10.021

access: closed

type: Journal Article

metadata version: 2021-12-30

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Jirí Hájek, Václav Papez, B. Kojecký:
Investigation of flicker noise in silicon diodes under reverse bias. Microelectron. Reliab. 52(3): 469-474 (2012)

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