"Improved analysis of low frequency noise in dynamic threshold MOS/SOI ..."

Sébastien Haendler et al. (2001)

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DOI: 10.1016/S0026-2714(01)00021-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sébastien Haendler, Jalal Jomaah, Gérard Ghibaudo, Francis Balestra:
Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. Microelectron. Reliab. 41(6): 855-860 (2001)

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