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"A hierarchical defect repair approach for hybrid nano/CMOS memory ..."

Mehdi Habibi, Hossein Pourmeidani (2014)

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DOI: 10.1016/J.MICROREL.2013.09.023

access: closed

type: Journal Article

metadata version: 2021-04-09

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Mehdi Habibi, Hossein Pourmeidani:
A hierarchical defect repair approach for hybrid nano/CMOS memory reliability enhancement. Microelectron. Reliab. 54(2): 475-484 (2014)

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