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"Measurement considerations for evaluating BTI effects in SiC MOSFETs."

Daniel B. Habersat, Aivars J. Lelis, Ronald Green (2018)

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DOI: 10.1016/J.MICROREL.2017.12.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Daniel B. Habersat, Aivars J. Lelis, Ronald Green:
Measurement considerations for evaluating BTI effects in SiC MOSFETs. Microelectron. Reliab. 81: 121-126 (2018)

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