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"Thermal imaging of smart power DMOS transistors in the thermally unstable ..."

Georg Haberfehlner et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.032

access: closed

type: Journal Article

metadata version: 2022-03-16

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Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany:
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectron. Reliab. 49(9-11): 1346-1351 (2009)

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