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"Switching times variation of power MOSFET devices after electrical stress."

R. Habchi et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.09.044

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/HabchiSMK07
R. Habchi, C. Salame, P. Mialhe, A. Khoury:
Switching times variation of power MOSFET devices after electrical stress. Microelectron. Reliab. 47(8): 1296-1299 (2007)

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