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"Analysis of origin of measured 1/f noise in high-power semiconductor laser ..."

Jian Guan et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.029

access: closed

type: Journal Article

metadata version: 2024-01-12

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Jian Guan, Shuxu Guo, Jin-Yuan Wang, Min Tao, Junsheng Cao, Fengli Gao:
Analysis of origin of measured 1/f noise in high-power semiconductor laser diodes far below threshold current. Microelectron. Reliab. 59: 55-59 (2016)

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