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"Electromagnetic immunity model of an ADC for microcontroller's reliability ..."
Jean-Baptiste Gros et al. (2009)
- Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant:
Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. Microelectron. Reliab. 49(9-11): 963-966 (2009)
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