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"On-wafer low frequency noise measurements of SiGe HBTs: Impact of ..."

Brice Grandchamp et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.020

access: closed

type: Journal Article

metadata version: 2020-02-22

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Brice Grandchamp, Cristell Maneux, Nathalie Labat, André Touboul, Thomas Zimmer:
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. Microelectron. Reliab. 44(9-11): 1387-1392 (2004)

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