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"Reliability analysis of temperature step-stress tests on III-V high ..."

José Ramón González et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.04.001

access: closed

type: Journal Article

metadata version: 2020-09-05

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  - journals/mr/GonzalezVNARG09
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  - https://dblp.org/rec/journals/mr/GonzalezVNARG09
José Ramón González, Manuel Vázquez, Neftalí Núñez, Carlos Algora, Ignacio Rey-Stolle, Beatriz Galiana:
Reliability analysis of temperature step-stress tests on III-V high concentrator solar cells. Microelectron. Reliab. 49(7): 673-680 (2009)

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