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"Impact of wafer charging on hot carrier reliability and optimization of ..."
Didier Goguenheim et al. (2005)
- Didier Goguenheim
, Alain Bravaix
, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, Philippe Boivin:
Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectron. Reliab. 45(3-4): 487-492 (2005)
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